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How to Grow and Model High Reliability III-V Semiconductor Devices

TitlePresenterAffiliation
III-V Epitaxial & Thin Film Deposition, Processes and OpportunitiesDr. Edwin L. PinerTexas State University
Device and Compact Modeling of InP HBTsDr. Markus MüllerTU Dresden, Rohde & Schwarz
Compact Modeling of GaN HEMTsDr. Lan WeiUniversity of Waterloo

Location: Ft. Lauderdale, Florida, USA
Date: Sunday, October 27, 2024
Duration: All Day with 90 minute segments (Presentation: 80 minutes + Questions: 10 minutes)

Additional Info

7:30 AM – 5:00 PMRegistration for Short Course & Primer Only
8:00 AM – 8:45 AMBreakfast Short Course & Primer
8:45 AM – 8:50 AMWelcome & Speaker Introduction, Doug Weiser, Texas Instruments
8:50 AM – 10:20 AMGaN Material, Fabrication, and Devices – Grace Xing, Cornell University
10:20 AM – 10:35 AMCoffee Break for Short Course & Primer
10:35 AM – 12:05 PMSiC Material, Fabrication and Devices – Victor Veliadis, North Carolina State University
12:05 PM – 1:15 PMLunch Break for Short Course Only
1:15 PM – 2:45 PMGaN Power Device Reliability – Enrico Zanoni, University of Padova
2:45 PM – 3:00 PMCoffee Break for Short Course Only
3:00 PM – 4:30 PMSiC Power Device Reliability – Brett Hull, Wolfspeed
4:30 PM – 4:45 PMAdjourn and feedback